Engineer Test
Resume:
Michael K. Larson
Seminole, FL **772
E-mail: ablzvw@r.postjobfree.com
EMPLOYMENT
HISTORY
**/** - **/** ** Sensors, Inc.
Senior RF Test Engineer
. Developed complete RF test solutions for LV Sensor's
integrated tire pressure monitor system IC, which
included software and hardware development.
. One design included a quad-site DUT board for
complete characterization of the RF sections of our
SOC (system on chip) requiring improved isolation
between the digital and analog circuitry which was
achieved by greatly modifying the board layout, with
measurements showing better than 60dB improvement of
'carrier to spurious noise' over those taken with
older boards under the same conditions.
. Provided correlation efforts between our production
testers and the bench setup.
. Software development done in LabView 8.2 and C/C++.
. Designed RF matching networks for maximum power
transfer to a 50 ohm load or to an antenna, sometimes
using a triple-stub tuner, and modeled / simulated
results with Matlab, Puff, and other programs.
. Debugged customer boards for RF failures and helped
with the design of new customer boards.
. Worked closely with systems and design engineers to
assure complete test coverage for characterization
and final test.
02/06 - 08/06 Skyworks Solutions, Inc.
Electrical Staff Engineer
. Worked with group of staff engineers supervising
testing of Skyworks' GaAs HBT power amplifier chip
line for the cellular telecommunications market.
. Provided assistance to junior engineers with their
test development solutions on both rack and stack
systems controlled by LabView and Skyworks' custom
built production test systems controlled by C/C#.
. Constantly involved with test time reduction efforts
including changes to software, board layout
modifications, and evaluation of new test &
measurement equipment.
. Worked closely with the production test house in
Mexicali, Mexico, and resolved tester / yield related
issues as they arose.
09/99 - 11/05 Conexant
RF Test Engineer III
. Developed complete high volume (more than 5 million
chips per month) production testing solutions for
Conexant's silicon satellite receiver RFIC product
line using Agilent's HP84000 RFIC test development
platform, with a constant emphasis on lower test
times and improved repeatability.
. Performed ATE correlations with bench measurements
using LabView software.
. Transferred, correlated, and monitored completed RFIC
test solutions to test houses in Mexico, Taiwan, and
South Korea.
. Designed all necessary test hardware for HP84000
testing, bench testing, and engineering evaluation
test boards using ORCAD schematic capture.
. One design included the development of the test
platform for a satellite receiver IC where, by
redesigning the input matching network and lowering
the output losses, was able to improve testing
repeatability as well as reduce total test time per
DUT by more than one second per device, resulting in
huge test cost savings.
. Another design was to implement a low cost solution
for providing a low phase noise reference signal to a
DUT that was locked to the HP84000 tester so that the
measurements could be taken coherently. This was
accomplished using a simple PLL circuit with an XOR
gate, low pass filter, and VCXO which provided a
clean output signal referenced to a dirty input
signal, eliminating the need to purchase expensive
signal generators.
. Developed the world's first dual site parallel test
solution for the HP84000 which provided a thirty one
percent reduction in total test time per device
compared to the single site solution.
. Transferred all HP84000 solutions and developed new
designs on LTX's Fusion-CX systems.
06/96 - 09/99 TRW, Space and Electronics Group
MTS II
. Created HP-VEE program routines used in the
automation of RF and DC on-wafer testing of microwave
circuits produced by TRW's GaAs and InP wafer
production line.
. Some HP-VEE designs included software used for the
characterization and database management of all RF
probes used in the lab, a pulsed DC biasing algorithm
used for testing high power circuits, and a complete
P1dB measurement suite.
. Test team leader for all noise figure, s-parameter,
and pulsed power measurements.
. Provided support to several technicians, monitored
measurement accuracy, and made improvements to
existing software/hardware as deemed necessary.
. Worked closely with design engineers and department
managers to implement new test algorithms and
prepared hardware requirements for testing of all new
HEMT, HBT, and MESFET circuits.
. Acquainted with a broad range of test equipment and
testing techniques covering DC to over 110GHz.
EDUCATION University of Hawaii, Manoa
B.S., Electrical Engineering
Graduation Date: 05/96
Relevant Coursework: Fields and Waves I and II, Microwave
Engineering, RF and Microwave Active Circuit Design,
Advanced Microwave Electronics, Analog/Digital
Communication Systems, Linear/Digital Control Systems,
Physical Electronics, and Instrumentation Systems
** Gaps in my employment history can be explained from my being disabled
due to Guillain Barre Syndrome which I received from a flu shot. I have
made a 100% recovery and am very motivated to return back to work at this
time.
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